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The
ShaH
family of industrial Shack-Hartmann
wavefront sensors
is intended for a wide range
of applications including fast and precise
quality control of optical
elements,
airflow analysis,
measurement of laser
beam parameters, etc.
The flexible design of the ShaH system allows optimizing the
sensor parameters for a particular application. An advantageous
feature of the device is the use of high-quality telescopes.
This allows minimizing the influence of the angle of incidence
of the analyzed beam on the instrumental function of the sensor.
A special high-precision algorithm for locating hartmannogramm
spots centers provides high accuracy of measurements even in
difficult viewing conditions.
TECHNICAL SPECIFICATION:
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dynamic range |
300:1 |
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measurement
precision
(for aberrations up to 4th order),
RMSE |
λ/30 |
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|
entrance pupil
diameter |
up to 120 mm |
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input radiation
power |
starting from 100
µW |
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time of single
measurement |
20 ms
(standard) |
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number of
frames
in one series
with possibility
of statistical processing |
up to 1000
(depending on
the computer RAM size) |
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software |
Windows 2000/XP/Vista |
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output data |
· wave aberration
map
(up to 55
Zernike
polynomials)
· high order and total maps
· map of measurement's error
over aperture
· PSF
· Strehl ratio
· spot displacement map
(raw data)
· unprocessed Shack-Hartman
image sequence |
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power source |
· 120/240 V
· 50/60 Hz |
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|
power
consumption |
<20 W |
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